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VulnerabilityPublished

CVE-2026-44763: SAP Manufacturing Integration and Intelligence · Path Traversal

Affects SAP Manufacturing Integration and IntelligenceSource CVE Database V5

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Not known to be exploited · CVSS 7.6 High.

Data as of 7 Nov 2026, 23:24 UTC

CVSS 3.1 base score
7.6High
How severe the flaw is on the 0–10 CVSS scale.
EPSS
0.3% chance of exploitation in 30 days – higher than 33% of CVEsExploit Prediction Scoring System: the likelihood attackers will use this flaw soon.
CVSS:3.1/AV:N/AC:H/PR:H/UI:R/S:C/C:H/I:H/A:H

Exploitation evidence

  1. Disclosed: evidence found.

    CVE published 11 Aug 2026

  2. Detectable: no evidence on record.

    No public nuclei template indexed

  3. Weaponized: no evidence on record.

    No public exploit code indexed in Metasploit or Exploit-DB

  4. Exploited in the wild: no evidence on record.

    Not in CISA KEV and no source reports exploitation

  5. Observed by OffSeq Mirage: no evidence on record.

    No attack traffic recorded by OffSeq Mirage sensors

A missing step is not evidence of safety. Sources: cve.org (opens in a new tab), the Metasploit, Exploit-DB and nuclei-templates index as of 7 Nov 2026.

What to do

Affected software

ProductAffectedFixed in
SAP_SESAP Manufacturing Integration and IntelligenceAffected
  • =15.5
Fixed in–

AI-suggested

Until a fix is released, organizations should monitor SAP advisories for updates and consider restricting privileged user access and validating inputs where possible to reduce risk.

Description

SAP Manufacturing Integration and Intelligence allows a privileged attacker to exploit insufficient file path validation in certain functions using specially crafted input. Exploitation also requires a legitimate user to subsequently access the attacker-influenced content and depends on conditions outside the attacker�s control. Successful exploitation could allow files to be written outside the intended directory and affect other components, resulting in a high impact on confidentiality, integrity, and availability.

References

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