CVE-2025-21053: Samsung Mobile Devices · Out-of-bounds Write
Affects Samsung Mobile DevicesSource CVE Database V5
Not known to be exploited · CVSS 4.0 Medium.
Data as of 26 Oct 2026, 14:05 UTC
- EPSS
- 0.1% chance of exploitation in 30 days – higher than 2% of CVEsExploit Prediction Scoring System: the likelihood attackers will use this flaw soon.
CVSS:3.1/AV:L/AC:L/PR:N/UI:N/S:U/C:N/I:L/A:NExploitation evidence
Disclosed: evidence found.
CVE published 10 Oct 2025
Detectable: no evidence on record.
No public nuclei template indexed
Weaponised: no evidence on record.
No public exploit code indexed in Metasploit or Exploit-DB
Exploited in the wildExploited: no evidence on record.
Not in CISA KEV and no source reports exploitation
Observed by OffSeq MirageSeen by Mirage: no evidence on record.
No attack traffic recorded by OffSeq Mirage sensors
A missing step is not evidence of safety. Sources: cve.org (opens in a new tab), the Metasploit, Exploit-DB and nuclei-templates index as of 26 Oct 2026.
What to do
AI-suggested
- Apply the SMR October 2025 Release 1 security update from Samsung as soon as it becomes available to ensure the vulnerability is patched.
- Enforce strict physical security controls to prevent unauthorized local access to mobile devices, including device lock policies and secure storage.
- Implement mobile device management (MDM) solutions to monitor device compliance and remotely enforce security policies.
- Educate users on the risks of local device access and encourage reporting of lost or stolen devices immediately.
- Restrict installation of untrusted applications that might exploit local vulnerabilities.
- Regularly audit and update device firmware and software to minimize exposure to known vulnerabilities.
- Consider additional endpoint protection solutions that can detect abnormal behavior indicative of memory corruption or exploitation attempts.
Description
Out-of-bounds write in the parsing header for JPEG decoding in libpadm.so prior to SMR Oct-2025 Release 1 allows local attackers to cause memory corruption.